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White Paper: Measurement Of Active And Passive Millimeter-Wave Devices Using Microstrip To Coplanar Line Transitions
By E. Artal, B. Aja, R. Garcia, M. Detratti, L.A. Rodriguez, Departamento de Ingeniería de Comunicaciones
Abstract
At millimeter-wave frequencies the use of coaxial based test fixtures does not provide an accurate characterization of planar passive or active devices. Tests using coplanar probes produce more reliable and repeatable device measurements. A suitable method to perform device characterization is through broadband coplanar to microstrip transitions. A test bench for obtaining S-parameters up to 50 GHz is described. Calibration method and test results of passive and active circuits and devices are presented. The obtained experimental S-parameters have been used for circuit design and further integration of millimeter-wave receiver systems.
This paper was originally presented at the 4th ESA Workshop on Millimetre Wave Technology and Applications, Espoo, Finland, 15-17 February 2006, Conference Proceedings, pp. 153-158. Reprinted with permission.
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