Featured Article: Enabling Simultaneous RF And DC Measurements During Wafer Probing
By Randall Lee, Keithley Instruments, and Bernard Berger, Mesatronic Group
Keithley Instruments and Mesatronic Group (Voiron, France) have formed a technical alliance to address the need for small-geometry mixed-RF and DC testing. Engineers from the two companies are working together to create probe cards for parametric test systems that take RF and low-level DC measurements on any combination of wafer prober pins.
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