White Paper

RF/Microwave Instrumentation Amplifiers Benefit from Spatially Power Combined Parallel-MMIC Amplifier Technology

Source: Giga-tronics Incorporated

RF/Microwave Instrumentation Amplifiers are ideal for applications involving EMC radiated susceptibility testing, the medical market, materials, chemicals, and many more. This white paper discusses how these amplifiers can benefit from spatially power combined parallel-MMIC amplifier technology.

access the White Paper!

Get unlimited access to:

Trend and Thought Leadership Articles
Case Studies & White Papers
Extensive Product Database
Members-Only Premium Content
Welcome Back! Please Log In to Continue. X

Enter your credentials below to log in. Not yet a member of RF Globalnet? Subscribe today.

Subscribe to RF Globalnet X

Please enter your email address and create a password to access the full content, Or log in to your account to continue.

or

Subscribe to RF Globalnet