|
|
OCXO Temperature Stability With TCXO Power Consumption
By Paul Kruczkowski, editor |
 |
 |
|
Many remote and mobile platforms have limited power supplies, and thus require components designed with low power consumption in mind. This equipment often requires precise frequency control over its operating temperature, so one component that can significantly impact power consumption is the oscillator. I was recently introduced to a new oscillator technology that marries the low power draw of a TCXO with the frequency vs. temperature performance of an OCXO.
Read more. |
|
|
|
|
SPONSOR |
|
|
Narda IDA-3106
The portable, low-weight IDA interference and direction analyzer is a highly sensitive signal analyzer, with an extremely fast sweep-time at 12 GHz/sec and a real-time bandwidth of up to 32 MHz for intercepting short-term signals. The unique smartDF direction finding mode manages triangulation results and automatically calculates emitter positions. Learn more.
|
|
|
|
|
Most Popular Articles |
|
|
|
|
|
Compact Antenna For MIMO LTE Mobile Phone Applications
Long-term evolution (LTE) is one of the 4th generation (4G) mobile communication technologies developed at different frequencies ranging from 400 MHz to 4 GHz with bandwidths up to 20 MHz. LTE technology facilitates multiple antennas performing both transmit and receive operations, (such as multiple-input-multiple-output, or MIMO, to support high data rate applications. However, integrating several antennas onto a printed circuit board (PCB) becomes progressively more difficult as each new generation of handsets experience miniaturization (that is thin, slim shapes). Read more.
|
|
RF Switch Matrix Basics: Configuring And Verifying With Simulation Tools
RF and microwave switch matrix solutions play a key role in a variety of test systems. At SenarioTek, we design and configure signal routing solutions that are often unique to a specific application. Over the years, we have found some basic steps that help facilitate the design process and ensure that the finished product meets the needs of the test system. This column covers what I believe are the most important initial steps in the process. This is the first in a series of guest columns by Bob Alman of SenarioTek. Read more.
|
|
High-Temperature, High-Power RF Life Testing Of GaN-On-SiC RF Power Transistors
As GaN power device technology matures and gains acceptance in the market place, suppliers who provide products using this promising technology must prove its reliability. This article provides an overview of the testing approaches used to establish failure rates and will provide a comparison of DC- and RF-based HTOL methods. Read more.
|
|
|
Most Popular News |
|
|
|
|
|
|
|
|
|
|
|
