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Extending Test Capabilities Of The PXI 3000 RF Test Solution With 3060 Series RF Combiner Modules
January 28, 2010
•Application Note: Extending Test Capabilities Of The PXI 3000 RF Test Solution With 3060 Series RF Combiner Modules
The purpose of this application note is to present the use of the 3060 Series PXI RF combiners under different application scenarios common to RF device testing. The various modules available within the 3060 family enable different applications to be performed with the PXI 3000 system. In some cases the addition of a simple RF combiner to the PXI system will increase system performance and efficiency in a more effective manner than through the addition of external components.
Introduction
In addition to providing summing of signals the 3060 Series modules support various input and output switched path configurations to enable testing of single port and multi-port RF devices and to enable test system internal calibration without the need to disconnect the test subject. The use of High Speed Electronic Switches in 3060 Series RF Combiners provide more reliable and faster switching than products based on mechanical switching. This feature makes the 3060 Series RF Combiners ideally suited for applications where high speed is critical.
Click Here To Download:•Application Note: Extending Test Capabilities Of The PXI 3000 RF Test Solution With 3060 Series RF Combiner Modules
